Surface chemical characterization of ceramic matrix composites (CMCs) with carbon ﬁber, silicon carbide (SiC) matrix, and various particulates (hafnium diboride and silicon nitride) using reﬂectance data obtained from a handheld fourier transform infrared spectroscopy device is presented. The models of the assumed physics (including measurement error processes) are discussed and then used to analyze data obtained from the CMCs. The validity of the assumptions that are implicitly made in the data analysis is evaluated. Estimated probability distribution functions of resonant wavenumbers (cm−1) obtained from the data are discussed with regard to identifying SiC and the presence of hafnium diboride. The results presented here and associ-ated techniques will be used to identify surface chemical changes in the materials after they have been exposed to high temperature environments.
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