Approaching a Videoscope’s Highest Physics Limited Resolution to Improve RVI

It’s happening now, the laws of physics are pushing the limits of what can be resolved with a 6mm videoscope. But wait, can’t you just put a higher pixel count chip and get more resolution? No, you can’t. Come find out why companies don’t advertise the pixel count of their videoscopes and why you should be weary of advertisements of more pixels when you’re looking for the best image. What kind of things truly go into producing high quality and high resolution videoscope image. This paper covers how optic companies optimize physics concepts such as the lens diffraction, Rayleigh criterion, Airy disc, circle of confusion, MTF, and aberration correction in reference to performing a remote visual inspection. Further explained is the actual requirements to use higher density CCD chips as well as the reasons why more pixels do not translate simply to a better image. The factor of light emission using laser diode technology, even dispersion, optimized optics, and finally the advanced processing and algorithms enhancements goes into capturing and generating the highest resolution image for industrial videoscope. Find out what goes into getting an inspector the very best chance at detecting issues, and seeing them clearly to make confident decisions.

References
  • Abramowitz, M., Spring, K. R., & Davidson, M. W. (2012, 01 01). Common Optical Defects in Lens Systems (Aberrations). Retrieved from Microscopy Resource Center: http://www.olympusmicro.com/primer/lightandcolor/opticalaberrations.html.
  • Cambridge In Colour. (2016, January 01). Retrieved September 1, 2016, from http://www.cambridgeincolour.com/tutorials/diffraction-photography.html.
  • Olympus Corporation. (2011, 01 01). What Are Industrial Videoscopes. Retrieved from Olympus IMS: http://www.olympus-ims.com/en/knowledge/remote-visual/industrial-videoscopes/.
  • The Institute of Optics. (2003, April 11). Aberrations. Retrieved from University of Rochester: http://www.optics.rochester.edu/workgroups/opt256/Ch03_Smith_MOE.pdf.
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