Publication: Publication Date: 1 March 2014Testing Method:
The Critical Role of High Resolution X-ray Micro-computed Tomography for Ultra-thin Wall Space Component Characterization
This paper describes component acceptance criteria; the computed tomography system hardware and procedure; detectability and measurement error assessment of the computed tomography system; specialized software needed to aid the characterization process; example computed tomography results; correlation with optical/scanning electron microscope characterization; and an overview of the modeling technique utilizing the computed tomography data.
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