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Near-Field Microwave In-Process Thickness Monitoring of Coatings Undergoing Curing

This paper presents an in-depth discussion of the problem along with demonstration of the capability of near-field microwave NDT techniques, using open-ended rectangular waveguide probes at X-band (8.2 to 12.4 GHz), to provide a linear correlation between measured data after each spray application to the final thickness for a coating primarily composed of commercially available polyurethane and resin.

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